In March I wrote about Point Projection Microscopy (PPM), in which electrons are emitted from a single-atom tip and accelerated to (and through) a target with very high coherence. The spatial resolution is quite high. I found that the same research group had earlier calculated that PPM should be able to distinguish atoms of differing atomic number one from another. This would imply analytical applications of the technique in addition to image formation. See arXiv:1101.5135.