Mutus et al. at the University of Alberta have recently examined a suspended graphene film by low energy electron point projection microscopy (LEEPPM). [arXiv:1102.1758] Even though the electron energy was only 100-200 eV, approximately 75% of the electrons get through the film. With an effective source size of < 5Å, imaging resolution is quite good. The authors claim that the low beam energy does not result in sample contamination in the way higher voltage techniques such as STEM do. (I find this claim puzzling, since it is the secondary electrons which are largely responsible for chemical reactions induced by high voltage e-beams.) They speculate that a graphene film could be used as the ultimate microscope slide for imaging thin objects by PPM.