In a paper coming out of Kamerlingh Onnes Laboratorium, Schramm et al. remind us that instability is inherent in aberration corrected electron microscopes. They propose that the system designer use a stability budget to trade off stability and resolution. The stability budget is somewhat orthogonal to the usual error budget. They further point out that real-time control is required to further advance TEM (and SEM, LEEM, etc. for that matter), but that suitable measurement parameters from which to derive feedback are presently unknown.
The paper is on the arXiv. It would appear that there’s an entrepreneurial opportunity here.