Papers from this year’s EIPBN (a.k.a. Beams) meeting are appearing on line . Among others, the paper by Mankos et al. describing a new electron monochromator  caught my eye. The novel concept is to use a single knife-edge to scrape both sides of an energy-dispersed beam by reflecting the beam back on itself.
The proceedings from Microscopy and Microanalysis 2016 are also on line . Since M&M is a huge conference, this runs to 53 screens listing titles, authors and DOI’s. In some ways it is easier to first download the program , available as a 72 page PDF.
 JVST B 34(6)2016
 Mankos et al., “Novel electron monochromator for high resolution imaging and spectroscopy”, JVST B 34, 06KP01 (2016)
 Microscopy and Microanalysis, 22 (S3) 2016, Proceedings …